| Original language | English |
|---|---|
| Pages (from-to) | 1044-1045 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 10 |
| Issue number | SUPPL. 2 |
| DOIs | |
| Publication status | Published - 2004 Sep 24 |
ASJC Scopus subject areas
- Instrumentation
A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons
Research output: Contribution to journal › Article › peer-review
1
Citation
(Scopus)