A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons

    Research output: Contribution to journalArticlepeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Pages (from-to)1044-1045
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume10
    Issue numberSUPPL. 2
    DOIs
    Publication statusPublished - 2004 Sep 24

    ASJC Scopus subject areas

    • Instrumentation

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