A geometric correction method for projected images using SIFT feature points

Toru Takahashi, Norihito Numa, Takafumi Aoki, Satoshi Kondo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

This paper proposes a geometric correction method for projected images using SIFT feature points. A projected image correction method based on projector-camera system needs to obtain the correspondence between projector and camera images, which is obtained by projecting the special patterns on a screen. The special patterns must be re-projected when changing the environment, e.g., the projecto or screen is moved. On the other hand, this paper proposes a geometric correction method using SIFT feature points on a projecte image which does not employ any special patterns to obtain the correspondence between projector and camera images. Experimental result shows that the use of our proposed method make it possible to correct distortion of projected images with only one snapshot.

Original languageEnglish
Title of host publicationPROCAMS 2008 - ACM/IEEE 5th International Workshop on Projector Camera Systems
DOIs
Publication statusPublished - 2008 Dec 1
EventACM/IEEE 5th International Workshop on Projector Camera Systems, PROCAMS 2008 - Marina del Rey, CA, United States
Duration: 2008 Aug 102008 Aug 10

Publication series

NamePROCAMS 2008 - ACM/IEEE 5th International Workshop on Projector Camera Systems

Other

OtherACM/IEEE 5th International Workshop on Projector Camera Systems, PROCAMS 2008
Country/TerritoryUnited States
CityMarina del Rey, CA
Period08/8/1008/8/10

Keywords

  • Geometric correction
  • Homography
  • Scale-invariant feature transform&Random sample consensus

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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