TY - GEN
T1 - A fault model for conducted intentional electromagnetic interferences
AU - Sauvage, Laurent
AU - Guilley, Sylvain
AU - Danger, Jean Luc
AU - Homma, Naofumi
AU - Hayashi, Yu-Ichi
PY - 2012/12/12
Y1 - 2012/12/12
N2 - Experimental setups used in electromagnetic compatibility tests can be used as platforms for fault injections. Faulting an equipment is a mean for a malevolent attacker to extract secret information. Compared to other fault injection setups, those based on EMC tests provide three advantages: non-invasivity, absence of synchronization, and frequency selectivity. This injection technique therefore allows the attacker to perform analysis with little knowledge of the targeted equipment. To assess the potential of this attack, a characterization of its effects is needed. This is the purpose of this paper. More precisely, our contributions are twofold: First of all, we observe that the faults are reproducible. Second, we show that the fault model is compatible with known attacks.
AB - Experimental setups used in electromagnetic compatibility tests can be used as platforms for fault injections. Faulting an equipment is a mean for a malevolent attacker to extract secret information. Compared to other fault injection setups, those based on EMC tests provide three advantages: non-invasivity, absence of synchronization, and frequency selectivity. This injection technique therefore allows the attacker to perform analysis with little knowledge of the targeted equipment. To assess the potential of this attack, a characterization of its effects is needed. This is the purpose of this paper. More precisely, our contributions are twofold: First of all, we observe that the faults are reproducible. Second, we show that the fault model is compatible with known attacks.
UR - http://www.scopus.com/inward/record.url?scp=84870705130&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84870705130&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2012.6351664
DO - 10.1109/ISEMC.2012.6351664
M3 - Conference contribution
AN - SCOPUS:84870705130
SN - 9781467320610
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 788
EP - 793
BT - EMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
T2 - 2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012
Y2 - 5 August 2012 through 10 August 2012
ER -