A failure-tolerant and spectrum-efficient wireless data center network design for improving performance of big data mining

Katsuya Suto, Hiroki Nishiyama, Nei Kato, Takayuki Nakachi, Toshikazu Sakano, Atsushi Takahara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Wireless Data Center Network (Wi-DCN) is considered one of the most promising future data center architectures due to its low installation and management cost and high flexibility of network design. However, the existing Wi-DCN is, still, not capable of providing an efficient big data mining service such as MapReduce because its topology (i.e., Cayley graph with same degree) cannot achieve enough connectivity on the breakdown of servers and spectrum efficiency, which are important factors to improve the performance of big data mining. Therefore, in order to modify the existing Wi-DCN for big data mining, this paper proposes a spherical rack architecture based on a bimodal degree distribution that improves both failure tolerance and spectrum efficiency. Extensive computer simulations demonstrate the effectiveness of our proposed rack architecture in terms of data transmission time required for MapReduce under a failure-prone environment.

Original languageEnglish
Title of host publication2015 IEEE 81st Vehicular Technology Conference, VTC Spring 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479980888
DOIs
Publication statusPublished - 2015 Jul 1
Event81st IEEE Vehicular Technology Conference, VTC Spring 2015 - Glasgow, United Kingdom
Duration: 2015 May 112015 May 14

Publication series

NameIEEE Vehicular Technology Conference
Volume2015
ISSN (Print)1550-2252

Other

Other81st IEEE Vehicular Technology Conference, VTC Spring 2015
CountryUnited Kingdom
CityGlasgow
Period15/5/1115/5/14

Keywords

  • Degree distribution
  • MapReduce performance
  • Rack design
  • Wireless data center network

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics

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