A double-modulation method of observing infrared emission spectra of thin films on metal surfaces

T. Wadayama, W. Shiraishi, A. Hatta, W. Suëtaka

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

We propose a double-modulation method for the in-situ observation of infrared emission spectra from thin films on metal surfaces at elevated temperatures. With this modulation method, emission spectra free from absorption of ambient gas are recorded. This method can eliminate, at the same time, sizable signals of background emission and compensate for the wavelength dependence of radiation intensity. An infrared emission spectrometer designed for the double-modulation measurement is described and typical results obtained with this apparatus are illustrated.

Original languageEnglish
Pages (from-to)43-47
Number of pages5
JournalApplied Surface Science
Volume44
Issue number1
DOIs
Publication statusPublished - 1990 Jan 1

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Fingerprint Dive into the research topics of 'A double-modulation method of observing infrared emission spectra of thin films on metal surfaces'. Together they form a unique fingerprint.

Cite this