A different type of reentrant behavior in superconductor/thin graphite film/superconductor Josephson junctions

T. Sato, A. Kanda, T. Moriki, H. Goto, S. Tanaka, Y. Ootuka, H. Miyazaki, S. Odaka, K. Tsukagoshi, Y. Aoyagi

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

We experimentally studied current-voltage characteristics of superconductor/thin graphite film/superconductor Josephson junctions. A reentrant behavior in the differential conductance was observed at low bias voltages just above the structure due to supercurrent. The gate voltage dependence of the conductance peak shows that the origin of the reentrant behavior is different from that for the conventional reentrant behavior seen in a disordered normal metal coupled to a superconductor.

Original languageEnglish
Pages (from-to)797-800
Number of pages4
JournalPhysica C: Superconductivity and its applications
Volume468
Issue number7-10
DOIs
Publication statusPublished - 2008 Apr 1
Externally publishedYes

Keywords

  • Graphite
  • Proximity effect
  • Reentrant behavior
  • Superconductivity

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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