A dead-time free global shutter CMOS image sensor with in-pixel LOFIC and ADC using pixel-wis e connections

Hidetake Sugo, Shunichi Wakashima, Rihito Kuroda, Yuichiro Yamashita, Hirofumi Sumi, Tzu Jui Wang, Po Sheng Chou, Ming Chieh Hsu, Shigetoshi Sugawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

An almost 100% temporal aperture (dead-time free) global shutter (GS) stacked CMOS image sensor (CIS) with in-pixel lateral overflow integration capacitor (LOFIC), ADC and DRAM is developed using pixel-wise connections. The prototype chip with 6.6μm-pitch VGA LOFIC pixel dead-time free GS mode and 1.65μm-pitch 4.9M sub-pixel high resolution rolling shutter (RS) mode was fabricated with a 45nm 1P4M CIS technology for PD substrate and a 65nm 1P5M CMOS technology for ASIC substrate.

Original languageEnglish
Title of host publication2016 IEEE Symposium on VLSI Circuits, VLSI Circuits 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509006342
DOIs
Publication statusPublished - 2016 Sep 21
Event30th IEEE Symposium on VLSI Circuits, VLSI Circuits 2016 - Honolulu, United States
Duration: 2016 Jun 142016 Jun 17

Publication series

NameIEEE Symposium on VLSI Circuits, Digest of Technical Papers
Volume2016-September

Other

Other30th IEEE Symposium on VLSI Circuits, VLSI Circuits 2016
CountryUnited States
CityHonolulu
Period16/6/1416/6/17

Keywords

  • CIS
  • LOFIC
  • global shutter
  • pixel-wise connection

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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