A colloid-SEM method for the study of fine magnetic domain structures

K. Goto, T. Sakurai

    Research output: Contribution to journalArticlepeer-review

    40 Citations (Scopus)

    Abstract

    A simple method to obtain fine magnetic domain patterns is described. The method has two processes, the first is to make the usual Bitter patterns and the second to observe dried colloidal particles on domain boundaries by a scanning electron microscope (SEM) in the secondary electron mode. Micrographs of domain patterns of hexagonal cobalt have been shown at magnifications of SEM from 2000 to 5000. Owing to the large focal depth of SEM, it is able to observe domains on both surfaces of a crystal edge at the same time, and examples have been shown.

    Original languageEnglish
    Pages (from-to)355-356
    Number of pages2
    JournalApplied Physics Letters
    Volume30
    Issue number7
    DOIs
    Publication statusPublished - 1977

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

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