A 60-ns 4-Mbit CMOS DRAM with Built-In Self-Test Function

Takashi Ohsawa, Tohru Furuyama, Yohji Watanabe, Hiroto Tanaka, Kenji Natori, Satoshi Shinozaki, Takeshi Tanaka, Satoshi Yamano, Yohsei Nagahama, Natsuki Kushiyama, Kenji Tsuchida

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

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Engineering & Materials Science