A 55-ns 16-Mb DRAM with Built-in Self-Test Function Using Microprogram ROM

Toshio Takeshima, Masahide Takada, Hiroki Koike, Hiroshi Watanabe, Shigeru Koshimaru, Kenjiro Mitake, Wataru Kikuchi, Takaho Tanigawa, Tatsunori Murotani, Kenji Noda, Kazuhiro Tasaka, Koji Yamanaka, Kuniaki Koyama

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

A single 5-V power supply 16-Mb dynamic random access memory (DRAM) has been developed, using a high-speed latched sensing scheme and a built-in self-test (BIST) function with a microprogrammed ROM, in which automatic test pattern generation procedures were stored by microcoded programs. The chip was designed using a double-level A1 wiring 0.55-µm CMOS technology. As a result, a 16-Mb CMOS DRAM with 55-ns typical access time and 130-mm2 chip area was attained by implementing 4.05-µm2 storage ceils. The installed ROM was composed of 18 words ×10 b, where the marching test and checkerboard scan write/read test procedures were stored, resulting in successful self-test operation. As the BIST circuit occupied 1 mm2 and the area overhead was about 1%, it proves to be promising for large-scale DRAM’s.

Original languageEnglish
Pages (from-to)903-911
Number of pages9
JournalIEEE Journal of Solid-State Circuits
Volume25
Issue number4
DOIs
Publication statusPublished - 1990 Aug
Externally publishedYes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'A 55-ns 16-Mb DRAM with Built-in Self-Test Function Using Microprogram ROM'. Together they form a unique fingerprint.

Cite this