A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function

Akira Tanabe, Toshio Takeshima, Hiroki Koike, Yoshiharu Aimoto, Masahide Takada, Toshiyuki Ishijima, Naoki Kasai, Hiromitsu Hada, Kentaro Shibahara, Takemitsu Kunio, Takaho Tanigawa, Takanori Saeki, Masato Sakao, Hidenobu Miyamoto, Hiroshi Nozue, Shuichi Ohya, Tatsunori Murotani, Kuniaki Koyama, Takashi Okuda

Research output: Contribution to journalArticlepeer-review

50 Citations (Scopus)

Fingerprint Dive into the research topics of 'A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function'. Together they form a unique fingerprint.

Engineering & Materials Science