A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function

Akira Tanabe; Toshio Takeshima; Hiroki Koike; Yoshiharu Aimoto; Masahide Takada; Toshiyuki Ishijima; Naoki Kasai; Hiromitsu Hada; Kentaro Shibahara; Takemitsu Kunio; Takaho Tanigawa; Takanori Saeki; Masato Sakao; Hidenobu Miyamoto; Hiroshi Nozue; Shuichi Ohya; Tatsunori Murotani; Kuniaki Koyama; Takashi Okuda

doi:10.1109/4.165332

A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function

Akira Tanabe, Toshio Takeshima, Hiroki Koike, Yoshiharu Aimoto, Masahide Takada, Toshiyuki Ishijima, Naoki Kasai, Hiromitsu Hada, Kentaro Shibahara, Takemitsu Kunio, Takaho Tanigawa, Takanori Saeki, Masato Sakao, Hidenobu Miyamoto, Hiroshi Nozue, Shuichi Ohya, Tatsunori Murotani, Kuniaki Koyama, Takashi Okuda

Research output: Contribution to journal › Article › peer-review

50 Citations (Scopus)

Abstract

A 64-Mb DRAM with a 30-ns access time and 19.48mm x 9.55-mm die size has been developed. For reducing inter-bit-line coupling noise, the DRAM features a latched-sense, shared-sense circuit with open bit-line readout and folded bit-line rewrite operations. To reduce test costs and increase chip reliability, it has been equipped with built-in self-test and self-repair (BIST and BISR) circuits that use spare SRAM cells.

Original language	English
Pages (from-to)	1525-1533
Number of pages	9
Journal	IEEE Journal of Solid-State Circuits
Volume	27
Issue number	11
DOIs	https://doi.org/10.1109/4.165332
Publication status	Published - 1992 Nov
Externally published	Yes

ASJC Scopus subject areas

Electrical and Electronic Engineering

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Tanabe, A., Takeshima, T., Koike, H., Aimoto, Y., Takada, M., Ishijima, T., Kasai, N., Hada, H., Shibahara, K., Kunio, T., Tanigawa, T., Saeki, T., Sakao, M., Miyamoto, H., Nozue, H., Ohya, S., Murotani, T., Koyama, K., & Okuda, T. (1992). A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function. IEEE Journal of Solid-State Circuits, 27(11), 1525-1533. https://doi.org/10.1109/4.165332

A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function. / Tanabe, Akira; Takeshima, Toshio; Koike, Hiroki; Aimoto, Yoshiharu; Takada, Masahide; Ishijima, Toshiyuki; Kasai, Naoki; Hada, Hiromitsu; Shibahara, Kentaro; Kunio, Takemitsu; Tanigawa, Takaho; Saeki, Takanori; Sakao, Masato; Miyamoto, Hidenobu; Nozue, Hiroshi; Ohya, Shuichi; Murotani, Tatsunori; Koyama, Kuniaki; Okuda, Takashi.

In: IEEE Journal of Solid-State Circuits, Vol. 27, No. 11, 11.1992, p. 1525-1533.

Research output: Contribution to journal › Article › peer-review

Tanabe, A, Takeshima, T, Koike, H, Aimoto, Y, Takada, M, Ishijima, T, Kasai, N, Hada, H, Shibahara, K, Kunio, T, Tanigawa, T, Saeki, T, Sakao, M, Miyamoto, H, Nozue, H, Ohya, S, Murotani, T, Koyama, K & Okuda, T 1992, 'A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function', IEEE Journal of Solid-State Circuits, vol. 27, no. 11, pp. 1525-1533. https://doi.org/10.1109/4.165332

Tanabe, Akira ; Takeshima, Toshio ; Koike, Hiroki ; Aimoto, Yoshiharu ; Takada, Masahide ; Ishijima, Toshiyuki ; Kasai, Naoki ; Hada, Hiromitsu ; Shibahara, Kentaro ; Kunio, Takemitsu ; Tanigawa, Takaho ; Saeki, Takanori ; Sakao, Masato ; Miyamoto, Hidenobu ; Nozue, Hiroshi ; Ohya, Shuichi ; Murotani, Tatsunori ; Koyama, Kuniaki ; Okuda, Takashi. / A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function. In: IEEE Journal of Solid-State Circuits. 1992 ; Vol. 27, No. 11. pp. 1525-1533.

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AU - Kasai, Naoki

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A 30-ns 64-Mb DRAM with Built-in Self-Test and Self-Repair Function

Abstract

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