4H-SiC/6H-SiC interface structures studied by high-resolution transmission electron microscopy

Hiroshi Iwasaki, Shinji Inoue, Tatsuo Yoshinobu, Masayoshi Tarutani, Yoshizo Takai, Ryuichi Shimizu, Akira Ito, Tsunenobu Kimoto, Hiroyuki Matsunami

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

The interface structures of 4H-SiC/6H-SiC heterostructures formed in monocrystalline bulk silicon carbide were studied by high-resolution electron microscopy of cross-sectional specimens. The samples were grown on the (0001̄) C face of a 6H-SiC seed with in situ Ce doping. The observed transition region is atomically flat over regions of several hundreds nm. The transition from the initial 6H-SiC growth to the 4H-SiC growth happens all at once at certain thicknesses with the occurrence of only a few layers of 4H-SiC (6H-SiC) before (after) the transition. The atomic stacking sequence at the interface of the two polytype crystals can be resolved.

Original languageEnglish
Pages (from-to)2636-2637
Number of pages2
JournalApplied Physics Letters
Volume63
Issue number19
DOIs
Publication statusPublished - 1993
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of '4H-SiC/6H-SiC interface structures studied by high-resolution transmission electron microscopy'. Together they form a unique fingerprint.

Cite this