Abstract
Microphase-separated structures of a Poly(deuterated styrene-block-2- vinylpyridine) (dPS-b-PVP) thin films were studied by transmission electron microtomography (TEMT) and neutron reflectivity (NR). Note that the dPS-b-PVP shows lamellar morphology in bulk. The thin film was prepared by spin-coating on a Si substrate, and then annealed at 170°C for 10 days before TEMT and NR experiments. Three-dimensional (3D) volume data was obtained by TEMT. Volume fractions of dPS in direction perpendicular to the substrate, i.e. depth profiles, were independently obtained from 3D volume data and NR. In addition, the depth profile obtained by TEMT was used as an initial guess in a model fitting of reflectivity profile. We examine the validity of such model fitting in the reflectivity measurements.
| Original language | English |
|---|---|
| Title of host publication | Polymer Preprints, Japan |
| Pages | 980 |
| Number of pages | 1 |
| Volume | 54 |
| Edition | 1 |
| Publication status | Published - 2005 |
| Externally published | Yes |
| Event | 54th SPSJ Annual Meeting 2005 - Yokohama, Japan Duration: 2005 May 25 → 2005 May 27 |
Other
| Other | 54th SPSJ Annual Meeting 2005 |
|---|---|
| Country/Territory | Japan |
| City | Yokohama |
| Period | 05/5/25 → 05/5/27 |
Keywords
- Block Copolymer
- Neutron Reflectivity
- Thin film(s)
- Transmission Electron Microtomography
ASJC Scopus subject areas
- Engineering(all)