Abstract
Microphase-separated structures of a Poly(deuterated styrene-block-2- vinylpyridine) (dPS-b-P2VP) thin films were studied by transmission electron microtomography (TEMT) and neutron reflectivity (NR). Note that the dPS-b-P2VP shows cylindrical morphology in bulk state. The thin films were prepared by spin-coating on a Si substrate, and then annealed at 170°C for 14 days before the TEMT and NR experiments. Three-dimensional (3D) volume data was obtained by TEMT. The concentration profile of dPS in direction perpendicular to the substrate, i.e. depth profiles, was independently obtained from 3D volume data and from NR. Furthermore, the concentration profile obtained by TEMT was used as an initial guess in a model fitting of reflectivity profile. We examine the validity of such model fitting in the reflectivity measurements.
| Original language | English |
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| Number of pages | 1 |
| Publication status | Published - 2006 Oct 19 |
| Externally published | Yes |
| Event | 55th SPSJ Annual Meeting - Nagoya, Japan Duration: 2006 May 24 → 2006 May 26 |
Other
| Other | 55th SPSJ Annual Meeting |
|---|---|
| Country/Territory | Japan |
| City | Nagoya |
| Period | 06/5/24 → 06/5/26 |
Keywords
- Block Copolymer
- Neutron Reflectivity
- Thin film(s)
- Transmission Electron Microtomography
ASJC Scopus subject areas
- Engineering(all)