Abstract
A 190-1100nm waveband multispectral imaging system is presented utilizing a high light resistance, wide dynamic range CMOS image sensor. The specially developed prototype image sensor exhibited 190-1100nm spectral sensitivity, 94dB wide dynamic range with 87ke- full well capacity and 1200fps frame rate, and no degradation of light sensitivity and dark current was observed after strong UV-light irradiation stress. With the developed system, real-time multispectral imaging using UV-Visible-Near IR light waveband was successfully conducted.
Original language | English |
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Title of host publication | IEEE Sensors, SENSORS 2016 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781479982875 |
DOIs | |
Publication status | Published - 2017 Jan 5 |
Event | 15th IEEE Sensors Conference, SENSORS 2016 - Orlando, United States Duration: 2016 Oct 30 → 2016 Nov 2 |
Other
Other | 15th IEEE Sensors Conference, SENSORS 2016 |
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Country | United States |
City | Orlando |
Period | 16/10/30 → 16/11/2 |
Keywords
- CMOS image sensor
- Spectral imaging
- UV-Visible-Near IR light waveband
ASJC Scopus subject areas
- Electrical and Electronic Engineering