190-1100 nm Waveband multispectral imaging system using high light resistance wide dynamic range CMOS image sensor

Yasuyuki Fujihara, Satoshi Nasuno, Shunichi Wakashima, Yusuke Aoyagi, Rihito Kuroda, Shigetoshi Sugawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A 190-1100nm waveband multispectral imaging system is presented utilizing a high light resistance, wide dynamic range CMOS image sensor. The specially developed prototype image sensor exhibited 190-1100nm spectral sensitivity, 94dB wide dynamic range with 87ke- full well capacity and 1200fps frame rate, and no degradation of light sensitivity and dark current was observed after strong UV-light irradiation stress. With the developed system, real-time multispectral imaging using UV-Visible-Near IR light waveband was successfully conducted.

Original languageEnglish
Title of host publicationIEEE Sensors, SENSORS 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479982875
DOIs
Publication statusPublished - 2017 Jan 5
Event15th IEEE Sensors Conference, SENSORS 2016 - Orlando, United States
Duration: 2016 Oct 302016 Nov 2

Other

Other15th IEEE Sensors Conference, SENSORS 2016
CountryUnited States
CityOrlando
Period16/10/3016/11/2

Keywords

  • CMOS image sensor
  • Spectral imaging
  • UV-Visible-Near IR light waveband

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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