(1101) twin dislocation structures in evaporated titanium thin films

L. A. Bursill, Ju Lin Peng, Xu Dong Fan, Y. Kasukabe, Y. Yamada

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

High-resolution transmission electron micrographs of (1101) interfacial twin dislocations in Ti thin films, previously published in this journal, are re-examined. Computer simulations of the experimental images have been obtained using atomic models deduced by Pond, Bacon and Serra in 1995. Two twin dislocations were analysed, with step heights of 4d(K1) and 2d(K1), where d(K1) is the spacing of the (1101) planes. Reasonable agreement with the predicted structures is obtained at about 0.17nm resolution.

Original languageEnglish
Pages (from-to)269-273
Number of pages5
JournalPhilosophical Magazine Letters
Volume71
Issue number5
DOIs
Publication statusPublished - 1995 May 1

ASJC Scopus subject areas

  • Condensed Matter Physics

Fingerprint

Dive into the research topics of '(1101) twin dislocation structures in evaporated titanium thin films'. Together they form a unique fingerprint.

Cite this