• 2391 Citations
  • 23 h-Index
1989 …2020

Research output per year

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Research Output

A High Near-Infrared Sensitivity over 70-dB SNR CMOS Image Sensor with Lateral Overflow Integration Trench Capacitor

Murata, M., Kuroda, R., Fujihara, Y., Otsuka, Y., Shibata, H., Shibaguchi, T., Kamata, Y., Miura, N., Kuriyama, N. & Sugawa, S., 2020 Apr 1, In : IEEE Transactions on Electron Devices. 67, 4, p. 1653-1659 7 p., 9031733.

Research output: Contribution to journalArticle

  • A high-precision 1 Ω-10 MΩ range resistance measurement platform for statistical evaluation of emerging memory materials

    Maeda, T., Omura, Y., Kuroda, R., Teramoto, A., Suwa, T. & Sugawa, S., 2020 Apr 1, In : Japanese journal of applied physics. 59, SG, SGGL03.

    Research output: Contribution to journalArticle

  • Open Access
  • Open Access
  • Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on Statistical Analysis of MOSFETs with Various Gate Shapes

    Akimoto, R., Kuroda, R., Teramoto, A., Mawaki, T., Ichino, S., Suwa, T. & Sugawa, S., 2020 Apr, 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 9128341. (IEEE International Reliability Physics Symposium Proceedings; vol. 2020-April).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution